Atomic Force Microscope

Atomic Force Microscopy (AFM) or Scanning Force Microscopy (SFM) is a type of scanning probe microscopy with resolution at the nanometer level. The information is gathered by ”touching” the surface with a mechanical probe. Piezoelectric elements allow for accurate and repeatable high-resolution movements.

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Design

$$F=k_N\Delta z$$

Where $z$ is the deflection and $k_N$ is the spring constant

And the resonant frequency $v_0$ is:

$$v_0=\frac{1}{2\pi }\sqrt{\frac{k_N}{m}}$$

and the spring constant is:

$$k_N=\frac{Ew{t}^3}{4l^3}$$

Where $t$ is thickness, $l$ length, $w$ width, and $E$ the youngs modulus/stiffness

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